Board Test Reval Hotel Olumpia, Tallin, Estonia May 25 - 26, 2005 Following the successful US-based Board Test Workshops (BTWs), the BTW Organizing Committee is organizing a 1-day European BTW event in association with the 2005 European Test Symposium. EBTW05 will focus on current issues and trends related to board test. Similar to earlier BTWs, perspectives are invited from contract manufacturers, test equipment providers, researchers, end users and systems providers.

Topics We cordially invite you to participate and submit your contribution to EBTW05, which includes (but is not limited to) the following single-board and multi-board test topics: Traditional Board Test Techniques Boundary Scan-based test techniques Assessing BSDL compliance and accuracy Board test: structural versus functional test Parametric testing OnBoard Built-In Self Test techniques Electrical, Optical and X-Ray board test mix Board test for high-volume consumer products Advances in flying probe technoilogy Creating board functional tests Advances in ICT fixturing Interfacing test flows with manufacturing flows Board test: linking ICT with low-cost PC testers Board test: fault-coverage metrics Board test: reducing false fails Applications of VXI/PXI plug and play technology In-System Configuration OnBoard programmability of CPLDs/FPGAs How to program PLDs to execute test functions New Standards and New Problems Practical use of P1581 Advances in 1149.6 AC-EXTEST Advances in 1149.4 Mixed-Signal test Bus Test techniques for SERDES boards At-speed board and system structural test Outsourcing to EMS companies Outsourcing to EMSs - issues and solutions Re-using prototype tests in volume manufacturing System-Level and Field-Service Test Using 1149.1 as a backplane test-bus 1149.1 backplane test-bus support devices Systems design integration and test issues Field servicing: test needs and solutions Board and System Test Economics Board test economics Emulation in a field-service environment Board test: educational requirements

Proceedings Proceedings: At the event, EBTW05 will deliver a CD-ROM of the accepted contributions whose authors wish to provide the corresponding materials.

MoleSystems © 2004