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Chilworth Manor, Chilworth, Southampton, UK
May 24 - 25, 2006
Following the successful USA Board Test Workshops (BTW) and the 2005 European BTW (EBTW),
the BTW Organizing Committee is organizing another EBTW event in association with the
2006 European Test Symposium.
EBTW’06 will focus on current issues and trends related to board test.
Similar to earlier BTWs, perspectives are invited from contract manufacturers,
test equipment providers, researchers, end users and systems providers.
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EBTW'06 is being held just after the 2006 European Test Symposium (ETS'06).
ETS'06 will be held on 21 - 24 May at the Hilton Hotel, Southampton.
Attendees to the EBTW'06 might also be interested to attend the ETS'06 event.
To find out more about ETS'06, follow the ETS'06 link
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We cordially invite you to participate and submit your contribution to EBTW06, which includes
(but is not limited to) the following single-board and multi-board test topics:
- Traditional Board Test Techniques
- Boundary Scan-based test techniques
- Assessing BSDL compliance and accuracy
- Board test: structural versus functional test
- Parametric testing
- OnBoard Built-In Self Test techniques
- Electrical, Optical and X-Ray board test mix
- Board test for high-volume consumer products
- Advances in flying probe technoilogy
- Creating board functional tests
- Advances in ICT fixturing
- Interfacing test flows with manufacturing flows
- Board test: linking ICT with low-cost PC testers
- Board test: fault-coverage metrics
- Board test: reducing false fails
- Applications of VXI/PXI plug and play technology
- System-Level and Field-Service Test
- Using 1149.1 as a backplane test-bus
- 1149.1 backplane test-bus support devices
- Systems design integration and test issues
- Field servicing: test needs and solutions
- New Standards and New Problems
- Practical use of P1581
- Advances in 1149.6 AC-EXTEST
- Advances in 1149.4 Mixed-Signal test Bus
- Test techniques for SERDES boards
- At-speed board and system structural test
- Outsourcing to EMS companies
- Outsourcing to EMSs - issues and solutions
- Re-using prototype tests in volume manufacturing
- In-System Configuration
- OnBoard programmability of CPLDs/FPGAs
- How to program PLDs to execute test functions
- Board and System Test Economics
- Board test economics
- Emulation in a field-service environment
- Board test: educational requirements
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Proceedings: At the event, EBTW06 will deliver a CD-ROM of the accepted contributions whose
authors wish to provide the corresponding materials.
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| March 24th, 2006: Submission (extended) |
| April 15th, 2006: Notification of acceptance |
| May 13th, 2006: Final paper due |
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General Chair: Jim Webster
Program Chair: Ben Bennetts
Program Vice Chair: Bill Eklow
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EBTW06 is sponsored by the
Test Technology Technical Council (TTTC)
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